SICK has launched a suite of Deep Learning apps and services to simplify machine vision quality inspection for challenging components, assemblies, surfaces or food produce, especially those that have previously defied automation and remained distinguishable only by human inspection.
SICK Deep Learning reduces set-up time and cost by enabling Artificial Intelligence image classification to run directly onboard SICK smart devices. With Deep Learning, programmable SICK devices take decisions automatically using specially-optimised neural networks and run inspections that would have previously been extremely challenging or simply impossible to achieve in high-speed automated processes across many different industries. [Read more…] about SICK’s deep learning brings simplicity to complex AI inspection
